WSE The Materials Characterization and Processing Core (MCP)

To become a user or request additional training, please fill out this form (Available through the MCP website as well)

Overview of Services

The Materials Characterization and Processing (MCP) core provides analytical instrumentation, preparation equipment, and processing capabilities for the development and characterization of new materials.
The MCP serves the entire JHU community mainly focusing on inorganic characterization and processing.
Included in the facility are:

  • Scanning Electron Microscopy
  • Focused Ion Beam
  • Transmission Electron Microscopy
  • Micro Computed Tomography
  • Xray Photospectroscopy
  • Auger Spectroscopy
  • X-ray Diffractometry
  • Various sample preparation equipment.

More instruments are scheduled to be installed over the next year, be sure to check back!

Leadership

Mitra Taheri - Director
Location: Maryland Hall 207
Phone: (410) 516-5592
E-mail: mtaheri4@jhu.edu

Ken Livi - Director of Operations
Location: Stieff Silver Building G10C
Phone: (410) 516-8342
E-mail: klivi@jhu.edu

Amy McFarland - Administrative Coordinator
Location: Stieff Silver Building G10
Phone: (410) 516-5339
E-mail: amcfar14@jh.edu MCPadmin@jhu.edu ; JHUMCP@jh.edu

 

 

Location and hours of operation

 

 Hours                                             Location

 Hours Open: 8:00am-5:00pm

Hours Staffed: 9:00am - 5:00pm

Stieff Silver Building

800 Wyman Park Drive

Baltimore, MD 21211

   

Links and Resources

  1. MCP: https://engineering.jhu.edu/MCP/
  2. Johns Hopkins Whiting School of Engineering: http://engineering.jhu.edu/
  3. Johns Hopkins University Labs: http://labs.jhu.edu/
  4. Become a user: Form

 

Contacts

Name Role Phone Email Location
Ken Livi
Director of Operations
 
410-516-8342
 
klivi@jhu.edu
 
Stieff Silver G10C
 
Amy McFarland
Administrative Coordinator
 
4105162203
 
amcfar14@jh.edu
 
Stieff Silver 800 Wyman Park Dr Baltimore, MD 21211
 

Available Equipment and Resources

Name Price
Buehler AutoMet 250 Grinder-Polisher  
F200 TEM  
FIBSEM  
FormAlloy L2 DED  
Gatan PIPS II  
Grand ARM II  
ICP-OES  
IT700H SEM  
Micro CT  
Sample Polishers - MD Hall  
TEM TF30  
XPS  
XRD - Maryland Hall - Aeris  
XRD - Stieff Bruker - 4-circle  

Map